modc wash Search Results


stem imaging mode  (JEOL)
96
JEOL stem imaging mode
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Stem Imaging Mode, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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stem mode  (Gatan Inc)
96
Gatan Inc stem mode
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Stem Mode, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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multi-mode optical fiber  (Fibercore)
90
Fibercore multi-mode optical fiber
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Multi Mode Optical Fiber, supplied by Fibercore, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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glass syringe  (Biochrom)
90
Biochrom glass syringe
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Glass Syringe, supplied by Biochrom, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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commercial mode-locked laser (mll) (lumentum ergo)  (Lumentum Uniphase Asia Limited)
90
Lumentum Uniphase Asia Limited commercial mode-locked laser (mll) (lumentum ergo)
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Commercial Mode Locked Laser (Mll) (Lumentum Ergo), supplied by Lumentum Uniphase Asia Limited, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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voltage exporter afg1022  (Tektronix inc)
90
Tektronix inc voltage exporter afg1022
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Voltage Exporter Afg1022, supplied by Tektronix inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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10 fs pulsed titanium sapphire laser  (Coherent Corp)
96
Coherent Corp 10 fs pulsed titanium sapphire laser
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
10 Fs Pulsed Titanium Sapphire Laser, supplied by Coherent Corp, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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ti sapphire laser  (Coherent Corp)
96
Coherent Corp ti sapphire laser
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Ti Sapphire Laser, supplied by Coherent Corp, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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mode locked argon ion laser  (Coherent Corp)
96
Coherent Corp mode locked argon ion laser
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Mode Locked Argon Ion Laser, supplied by Coherent Corp, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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single-mode, continuous-wave fiber laser  (IPG Photonics)
90
IPG Photonics single-mode, continuous-wave fiber laser
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Single Mode, Continuous Wave Fiber Laser, supplied by IPG Photonics, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atom probe microscope cameca leap 4000x hr  (CAMECA Inc)
90
CAMECA Inc atom probe microscope cameca leap 4000x hr
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Atom Probe Microscope Cameca Leap 4000x Hr, supplied by CAMECA Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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oim analysis v6 2 1 software  (Gatan Inc)
96
Gatan Inc oim analysis v6 2 1 software
Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification <t>ADF-STEM</t> image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film <t>and</t> <t>Al2O3</t> substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.
Oim Analysis V6 2 1 Software, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification ADF-STEM image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film and Al2O3 substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.

Journal: Advanced materials (Deerfield Beach, Fla.)

Article Title: Self-Oxidation Resistance of the Curved Surface of Achromatic Copper.

doi: 10.1002/adma.202210564

Figure Lengend Snippet: Figure 3. Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification ADF-STEM image of a top part of B-ACF, (middle) composite elemental maps of Cu (Cu K = 8.04 keV, green) and oxygen (O K = 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film and Al2O3 substrate. The white dashed square in the elemental map of middle panel denotes the imaging region. b,c) (left) ADF-STEM images of parts (denoted by L and R in (a)) of Cu nanograin depicting atomic steps on the surface and (right) superposition of atomic model with A–B–C planar stacking on each structure image. d) Projected atomic distance (PAD) maps for left (L), right (R), and top (T) parts of chosen Cu nanograin (denoted in a) and histogram of the measured PADs. e) DFT results. (left) Relative total energy profile of the O atom penetrating from outside into inside of biatomic step edge of a curved surface (violet open square □), compared with the biatomic step edge of a flat surface (black open square □); (right) Compression of the interlayer distances in (001) direction near the biatom step edge of curved surface of ACF. Blue spheres represent Cu atoms in bulk and dark blue spheres represent Cu atoms in the steps.

Article Snippet: In combination with STEM imaging, elemental mapping of the Cu films grown on Al2O3 (0001) substrates was performed in the same STEM imaging mode using an EDX spectrometer (JED-2300T, JEOL) with a dual-type silicon drift detector and a large effective solid angle (≈1.2 sr).

Techniques: Imaging